Invention Grant
- Patent Title: Systems and methods for reading machine-readable marks on racks and receptacles
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Application No.: US15332729Application Date: 2016-10-24
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Publication No.: US10043047B2Publication Date: 2018-08-07
- Inventor: David Opalsky
- Applicant: GEN-PROBE INCORPORATED
- Applicant Address: US CA San Diego
- Assignee: GEN-PROBE INCORPORATED
- Current Assignee: GEN-PROBE INCORPORATED
- Current Assignee Address: US CA San Diego
- Agent Brian S. Sun; Kyle E. Conklin
- Main IPC: G06K19/00
- IPC: G06K19/00 ; G06K7/10 ; G06K19/06 ; G06K7/14

Abstract:
A sample processing or assay instrument includes a moveable support. The moveable support defines a first pocket configured to receive a first object having a first machine-readable mark. The moveable support defines a second pocket configured to receive a second object having a second machine-readable mark. The moveable support also includes a first fiducial machine-readable mark and a second fiducial machine-readable mark. The instrument also includes an image capture device that captures a first image including the first fiducial machine-readable mark and the first machine-readable mark of the first object. The image capture device captures a second image that includes the second fiducial machine-readable mark and the second machine-readable mark of the second object. The instrument also includes a processor configured to associate information decoded from the first and second machine-readable marks with first and second locations on the moveable support.
Public/Granted literature
- US20170235984A1 SYSTEMS AND METHODS FOR READING MACHINE-READABLE MARKS ON RACKS AND RECEPTACLES Public/Granted day:2017-08-17
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