Invention Grant
- Patent Title: Matrix device, measurement method of characteristics thereof, and driving method thereof
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Application No.: US14844390Application Date: 2015-09-03
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Publication No.: US10043427B2Publication Date: 2018-08-07
- Inventor: Hiroyuki Miyake
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2014-180765 20140905
- Main IPC: G09G3/32
- IPC: G09G3/32 ; G09G3/00 ; G01R19/00 ; G01R19/10 ; G09G3/3233

Abstract:
To provide a measurement method of characteristics of an electrical element which causes variation in the luminance of pixels. In a device which includes components (pixels) arranged in a matrix and a wiring and where each component is can supply current to the wiring through an electrical element included in each component, the directions of current in N components capable of supplying current to the wiring are individually set and the current flowing through the wiring is measured N times. Here, the directions of the current flowing through the electrical elements can be changed. In the respective N measurements, combinations of the directions of current in the N components differ from one another. The amount of current flowing through each electrical element is calculated based on current obtained by the N measurements and the combinations of the directions of the current in the N measurements.
Public/Granted literature
- US20160071446A1 MATRIX DEVICE, MEASUREMENT METHOD OF CHARACTERISTICS THEREOF, AND DRIVING METHOD THEREOF Public/Granted day:2016-03-10
Information query
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