Invention Grant
- Patent Title: Nonvolatile memory device and method of reading the same
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Application No.: US15447357Application Date: 2017-03-02
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Publication No.: US10043583B2Publication Date: 2018-08-07
- Inventor: Sang-wan Nam , Dae-seok Byeon , Chi-weon Yoon
- Applicant: Sang-wan Nam , Dae-seok Byeon , Chi-weon Yoon
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2016-0151307 20161114
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/34 ; G11C16/04 ; G11C16/28 ; G11C16/10 ; G11C16/16

Abstract:
Provided are a nonvolatile memory device and a method of performing a sensing operation on the nonvolatile memory device. The nonvolatile memory device includes a control logic coupled to a memory cell array including strings. The control logic is configured to control a first weak-on voltage applied to an unselected string selection line and a second weak-on voltage applied to an unselected ground selection line during a setup interval of the sensing operation for sensing data from a selected string. The unselected string selection line and ground selection line are connected to a string selection transistor and a ground selection transistor, respectively, of a same unselected string. The selected string and the unselected string are connected to a same bit line. The first weak-on voltage and second weak-on voltage are respectively less than a threshold voltage of the string selection transistor and the ground selection transistor in the unselected string.
Public/Granted literature
- US20180137925A1 NONVOLATILE MEMORY DEVICE AND METHOD OF READING THE SAME Public/Granted day:2018-05-17
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