Invention Grant
- Patent Title: Damaging integrated circuit components
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Application No.: US15722219Application Date: 2017-10-02
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Publication No.: US10043765B2Publication Date: 2018-08-07
- Inventor: Cyril Cabral, Jr. , Kenneth P. Rodbell
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Adolph Bohnstedt; Arnold B. Bangali
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L27/24 ; H01L21/768

Abstract:
An integrated circuit structure and formation thereof. The integrated circuit structure includes a substrate and a front-end-of-the-line (FEOL) portion. The FEOL portion rests on top of and in contact with the substrate. The integrated circuit structure includes a memory level portion. The memory level portion rests on top of and in contact with the FEOL portion. The integrated circuit structure includes a back-end-of-the-line (BEOL) portion. The BEOL portion rests on top of and in contact with the memory level portion. The integrated circuit structure includes a multiple layer that includes one or more pairs of reactive materials. The multiple layer is one or more of: i) on top of the BEOL portion; ii) within the BEOL portion; iii) within the memory level portion; iv) within the FEOL portion; v) embedded in the substrate; and vi) on bottom of a thinned substrate.
Public/Granted literature
- US20180047679A1 DAMAGING INTEGRATED CIRCUIT COMPONENTS Public/Granted day:2018-02-15
Information query
IPC分类: