Invention Grant
- Patent Title: Latchup reduction by grown orthogonal substrates
-
Application No.: US15680903Application Date: 2017-08-18
-
Publication No.: US10043867B2Publication Date: 2018-08-07
- Inventor: James Fred Salzman , Charles Clayton Hadsell
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Charles A. Brill; Frank D. Cimino
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L21/265 ; H01L21/324 ; H01L21/74 ; H01L21/82 ; H01L21/8249 ; H01L21/8234 ; H01L27/06 ; H01L27/088 ; H01L27/092 ; H01L29/10 ; H01L29/78

Abstract:
An integrated circuit is formed by providing a heavily doped substrate of a first conductivity type, forming a lightly doped lower epitaxial layer of the first conductivity type over the substrate, implanting dopants of the first conductivity type into the lower epitaxial layer in an area for a shallow component and blocking the dopants from an area for a deep component, forming a lightly doped upper epitaxial layer over the lower epitaxial layer and activating the implanted dopants to form a heavily doped region. The shallow component is formed over the heavily doped region, and the deep component is formed outside the heavily doped region, extending through the upper epitaxial layer into the lower epitaxial layer.
Public/Granted literature
- US20170345894A1 LATCHUP REDUCTION BY GROWN ORTHOGONAL SUBSTRATES Public/Granted day:2017-11-30
Information query
IPC分类: