Invention Grant
- Patent Title: Diagnostic data generation apparatus, integrated circuit and method of generating diagnostic data
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Application No.: US14390193Application Date: 2012-04-05
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Publication No.: US10049428B2Publication Date: 2018-08-14
- Inventor: Michael Staudenmaier , Kshitij Bajaj , Mehul Kumar , Steven McAslan , Sarthak Mittal
- Applicant: Michael Staudenmaier , Kshitij Bajaj , Mehul Kumar , Steven McAslan , Sarthak Mittal
- Applicant Address: US TX Austin
- Assignee: NXP USA, Inc.
- Current Assignee: NXP USA, Inc.
- Current Assignee Address: US TX Austin
- International Application: PCT/IB2012/051701 WO 20120405
- International Announcement: WO2013/150342 WO 20131010
- Main IPC: G06T1/60
- IPC: G06T1/60 ; G09G3/20 ; G09G5/36 ; G09G5/00 ; G09G5/393

Abstract:
A diagnostic data generation apparatus for a display controller comprises an underrun detector arranged to monitor, when in use, buffer depletion in order to detect an underrun condition. The underrun condition results from a data feed lag associated with a mismatch between a buffer fill rate and a predetermined output data rate. The underrun detector is arranged to generate diagnostic data in response to detection of the underrun condition, the diagnostic data identifying the underrun condition and a location in an array of pixels associated with the underrun condition.
Public/Granted literature
- US20150161759A1 DIAGNOSTIC DATA GENERATION APPARATUS, INTEGRATED CIRCUIT AND METHOD OF GENERATING DIAGNOSTIC DATA Public/Granted day:2015-06-11
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