Invention Grant
- Patent Title: Automated cephalometric analysis using machine learning
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Application No.: US15250284Application Date: 2016-08-29
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Publication No.: US10049457B2Publication Date: 2018-08-14
- Inventor: Zeev Abraham , Daniel Abraham
- Applicant: CephX Technologies Ltd.
- Applicant Address: IL Herzeliya
- Assignee: CephX Technologies Ltd.
- Current Assignee: CephX Technologies Ltd.
- Current Assignee Address: IL Herzeliya
- Agency: Intrinsic Law Corp.
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/60 ; G06K9/36 ; A61B6/14 ; A61B6/00

Abstract:
A system and method are described for automating the analysis of cephalometric x-rays. Included in the analysis is a method for automatic anatomical landmark localization based on convolutional neural networks. In an aspect, the system and method employ a deep database of images and/or prior image analysis results so as to improve the outcome from the present automated landmark detection scheme.
Public/Granted literature
- US20180061054A1 Automated Cephalometric Analysis Using Machine Learning Public/Granted day:2018-03-01
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