Invention Grant
- Patent Title: Method and apparatus for process corner compensation for memory state sensing
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Application No.: US15450183Application Date: 2017-03-06
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Publication No.: US10049752B1Publication Date: 2018-08-14
- Inventor: Qiang Tang , Kalyan C. Kavalipurapu
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Alliance IP, LLC
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/06 ; G11C16/26 ; G11C16/04 ; G11C16/24 ; G11C16/10

Abstract:
In one embodiment, an apparatus comprises a memory array; a sense circuit comprising a first transistor and a sense node coupled to the first transistor and selectively coupled to a memory cell of the memory array via a data line; and a tracking circuit comprising a second transistor having a threshold voltage that is to track a threshold voltage of the first transistor, the tracking circuit to generate at least one sensing parameter of the sense circuit based on the threshold voltage of the second transistor.
Public/Granted literature
- US20180254089A1 METHOD AND APPARATUS FOR PROCESS CORNER COMPENSATION FOR MEMORY STATE SENSING Public/Granted day:2018-09-06
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