Invention Grant
- Patent Title: Method of fabricating package structures
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Application No.: US15681030Application Date: 2017-08-18
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Publication No.: US10049889B2Publication Date: 2018-08-14
- Inventor: Yu-Hsiang Hu , Chung-Shi Liu , Hung-Jui Kou , Sih-Hao Liao
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/32 ; H01L21/768 ; H01L21/311 ; G03F7/20 ; H01L21/027 ; H01L21/56 ; H01L23/00 ; H01L21/02

Abstract:
Some embodiments contemplate methods for forming a package structure and a package structure formed thereby. An embodiment method includes depositing a photosensitive dielectric layer on a support structure; forming a first layer on a surface of the photosensitive dielectric layer; exposing the photosensitive dielectric layer to radiation; and after the forming the first layer and the exposing to radiation, developing the photosensitive dielectric layer. The support structure includes an integrated circuit die. The layer has a different removal selectivity than the photosensitive dielectric layer during the developing. According to some embodiments, a thickness uniformity of the photosensitive dielectric layer after developing may be increased, and thickness loss from developing the photosensitive dielectric layer can be reduced.
Public/Granted literature
- US20170345675A1 PACKAGE STRUCTURES AND METHOD OF FORMING THE SAME Public/Granted day:2017-11-30
Information query
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