Invention Grant
- Patent Title: Semiconductor device
-
Application No.: US15671503Application Date: 2017-08-08
-
Publication No.: US10050108B2Publication Date: 2018-08-14
- Inventor: Takashi Okawa
- Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Applicant Address: JP Toyota
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee Address: JP Toyota
- Agency: Oliff PLC
- Priority: JP2016-189852 20160928
- Main IPC: H01L29/08
- IPC: H01L29/08 ; H01L27/04 ; H01L29/06 ; H01L29/16 ; H01L29/423 ; H01L29/78 ; H01L29/20

Abstract:
A semiconductor device may include a semiconductor layer, an insulation gate section, and a first conductivity-type semiconductor region; wherein the semiconductor layer may include a vertical drift region being of a second conductivity type and disposed at the one of main surfaces; a body region being of the first conductivity type, adjoining the vertical drift region, and disposed at the one of main surfaces; and a source region being of the second conductivity type, separated from the vertical drift region by the body region, and disposed at the one of main surfaces, wherein the insulation gate section is opposed to a portion of the body region which separates the vertical drift region and the source region; and the first conductivity-type semiconductor region is opposed to at least a part of a portion of the vertical drift region which is disposed at the one of main surfaces.
Public/Granted literature
- US20180090571A1 SEMICONDUCTOR DEVICE Public/Granted day:2018-03-29
Information query
IPC分类: