Invention Grant
- Patent Title: Semiconductor apparatus and characteristic measurement circuit therefor
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Application No.: US15225912Application Date: 2016-08-02
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Publication No.: US10054632B2Publication Date: 2018-08-21
- Inventor: Jin Yong Seong
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2016-0036160 20160325
- Main IPC: G01R31/26
- IPC: G01R31/26 ; H01L21/66 ; H01L21/78 ; H01L23/544
Abstract:
A semiconductor apparatus may include a unit chip and a characteristic measurement circuit configured to include a plurality of unit elements for test and to output electrical characteristic information of the plurality of unit elements for test.
Public/Granted literature
- US20170276719A1 SEMICONDUCTOR APPARATUS AND CHARACTERISTIC MEASUREMENT CIRCUIT THEREFOR Public/Granted day:2017-09-28
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