Invention Grant
- Patent Title: Foreign-matter detecting apparatus and method for detecting foreign-matter in powder using terahertz pulse wave
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Application No.: US14408392Application Date: 2013-06-14
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Publication No.: US10054685B2Publication Date: 2018-08-21
- Inventor: Ryoichi Fukasawa , Shigenori Tominaga
- Applicant: NIPRO CORPORATION
- Applicant Address: JP Osaka
- Assignee: NIPRO CORPORATION
- Current Assignee: NIPRO CORPORATION
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2012-137127 20120618
- International Application: PCT/JP2013/066479 WO 20130614
- International Announcement: WO2013/191103 WO 20131227
- Main IPC: G01S17/02
- IPC: G01S17/02

Abstract:
A foreign matter detecting apparatus includes an oscillating unit, an optical system, a receiving unit, a scanning mechanism, and an operator. The oscillating unit generates a terahertz pulse wave and emits the terahertz pulse wave as irradiation light. The optical system guides the irradiation light to the first part of the container and condenses reflected light from the container. The receiving unit outputs a signal corresponding to the condensed reflected light and also measures an echo. The scanning mechanism scans a position of the irradiation light guided on the first part in a two-dimensional manner. The operator detects foreign matter in powder in a container based on at least one of a time waveform signal, a reflection image, a power spectrum, a tomographic image, and a frequency image. The time waveform signal is output from the receiving unit in chronological order.
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