Invention Grant
- Patent Title: Visualization of analysis process parameters for layout-based checks
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Application No.: US14716775Application Date: 2015-05-19
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Publication No.: US10055533B2Publication Date: 2018-08-21
- Inventor: Patrick D Gibson , Farhad T Kharas , I-Shan Chang , MacDonald Hall Jackson, III
- Applicant: Mentor Graphics Corporation
- Applicant Address: US OR Wilsonville
- Assignee: Mentor Graphics Corporation
- Current Assignee: Mentor Graphics Corporation
- Current Assignee Address: US OR Wilsonville
- Agency: Klarquist Sparkman, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
Techniques and mechanisms for marking the parameters of a circuit analysis process for visual identification are disclosed. The visually-identified parameters can then be employed with the results of the circuit analysis to debug the layout design.
Public/Granted literature
- US20160342728A1 Visualization Of Analysis Process Parameters For Layout-Based Checks Public/Granted day:2016-11-24
Information query
