Invention Grant
- Patent Title: Localized redistribution layer structure for embedded component package and method
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Application No.: US15599667Application Date: 2017-05-19
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Publication No.: US10056360B2Publication Date: 2018-08-21
- Inventor: Alan J. Magnus
- Applicant: NXP USA, INC.
- Applicant Address: US TX Austin
- Assignee: NXP USA, INC.
- Current Assignee: NXP USA, INC.
- Current Assignee Address: US TX Austin
- Main IPC: H01L21/48
- IPC: H01L21/48 ; H01L23/00 ; H01L23/522 ; H01L25/16 ; H01L25/065 ; H01L21/56 ; H01L23/498 ; H01L25/00 ; H01L23/66 ; H01L25/075 ; H01L23/538 ; H01L25/07 ; H01L23/31 ; H01L23/528 ; H01L25/04 ; H01L25/11

Abstract:
An embedded component package includes an embedded component substrate. The embedded component substrate includes an electronic component having an active surface including bond pads and a package body encapsulating the electronic component. The package body includes a principle surface coplanar with the active surface, A localized redistribution layer (RDL) dielectric layer is on the active surface. A localized RDL conductive layer is on the localized RDL dielectric layer and is coupled to the bond pads through openings in localized RDL dielectric layer. A primary RDL dielectric layer encloses the entire embedded component substrate and directly contacts the localized RDL dielectric layer, the localized RDL conductive layer, and the principal surface of the package body. The localized RDL conductive layer provides additional space for routing of additional interconnects while the localized RDL dielectric layer acts as a stress buffer.
Public/Granted literature
- US20170256525A1 LOCALIZED REDISTRIBUTION LAYER STRUCTURE FOR EMBEDDED COMPONENT PACKAGE AND METHOD Public/Granted day:2017-09-07
Information query
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