Invention Grant
- Patent Title: Spectrometer, and spectrometer production method
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Application No.: US15116893Application Date: 2015-02-03
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Publication No.: US10060792B2Publication Date: 2018-08-28
- Inventor: Takafumi Yokino , Katsumi Shibayama
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2014-020667 20140205
- International Application: PCT/JP2015/052926 WO 20150203
- International Announcement: WO2015/119094 WO 20150813
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01J3/18 ; G01J3/36 ; G01J3/04

Abstract:
A spectrometer includes a light detection element provided with a light passing part, a first light detection part, and a second light detection part, a support fixed to the light detection element such that a space is formed, a first reflection part provided in the support and configured to reflect light passing through the light passing part in the space, a second reflection part provided in the light detection element and configured to reflect the light reflected by the first reflection part in the space, and a dispersive part provided in the support and configured to disperse and reflect the light reflected by the second reflection part to the first light detection part in the space. A plurality of second light detection parts is disposed in a region surrounding the second reflection part.
Public/Granted literature
- US20170167917A1 SPECTROMETER, AND SPECTROMETER PRODUCTION METHOD Public/Granted day:2017-06-15
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