Invention Grant
- Patent Title: Ophthalmic analysis apparatus and ophthalmic analysis program
-
Application No.: US14061178Application Date: 2013-10-23
-
Publication No.: US10064546B2Publication Date: 2018-09-04
- Inventor: Ai Yamakawa , Norimasa Satake , Tetsuya Kano , Hisanori Torii
- Applicant: NIDEK CO., LTD.
- Applicant Address: JP Gamagori, Aichi
- Assignee: NIDEK CO., LTD.
- Current Assignee: NIDEK CO., LTD.
- Current Assignee Address: JP Gamagori, Aichi
- Agency: Sughrue Mion, PLLC
- Priority: JP2012-235206 20121024; JP2012-235207 20121024; JP2012-235208 20121024
- Main IPC: G06K9/00
- IPC: G06K9/00 ; A61B3/00 ; A61B3/10 ; G06F19/00

Abstract:
An ophthalmic analysis apparatus is the ophthalmic analysis apparatus for obtaining analysis results of tomography images of a subject eye acquired at different dates by ophthalmic optical coherence tomography and outputting statistical information formed based on time-series data of the analysis results, and includes instruction receiving means for receiving selection instructions to select an analytical region on a subject eye from an examiner, and control means for respectively acquiring analysis results in the analytical region selected by the instruction receiving means with respect to tomography images acquired at the different dates and outputting the statistical information.
Public/Granted literature
- US20140112562A1 OPHTHALMIC ANALYSIS APPARATUS AND OPHTHALMIC ANALYSIS PROGRAM Public/Granted day:2014-04-24
Information query