Invention Grant
- Patent Title: Integrated circuit comprising multi-layer micromechanical structures with improved mass and reliability by using modified vias and method for forming the same
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Application No.: US15568140Application Date: 2016-04-20
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Publication No.: US10065855B2Publication Date: 2018-09-04
- Inventor: Piotr Jozef Michalik , Daniel Fernández Martínez , Jordi Madrenas Boadas
- Applicant: UNIVERSITAT POLITÈCNICA DE CATALUNYA , Daniel Fernández Martínez
- Applicant Address: ES Barcelona ES Palleja
- Assignee: UNIVERISTAT POLITECNICA DE CATALUNYA,Daniel Fernandez Martinez
- Current Assignee: UNIVERISTAT POLITECNICA DE CATALUNYA,Daniel Fernandez Martinez
- Current Assignee Address: ES Barcelona ES Palleja
- Priority: EP15164506 20150421
- International Application: PCT/IB2016/000490 WO 20160420
- International Announcement: WO2016/170412 WO 20161027
- Main IPC: B81C1/00
- IPC: B81C1/00 ; B81B3/00 ; B81B7/00

Abstract:
An integrated circuit and the method to produce the integrated circuit comprising: a substrate (10); active devices (11); plurality of metal layers (17), wherein said metal layers are separated by dielectric layers (13) and connected to each other by plurality of vias (19); at least one micromechanical region (15) wherein some of the dielectric layers are removed leaving hollow spaces (23), thereby some of said metal and via layers form a micromechanical device in said micromechanical region, wherein said micromechanical device comprises at least one multi-layer structure (165) that is built of a plurality of metal layers and at least one via layer and said multi-layer structure is characterized by that at least two metal layers of said multi-layer structure are joined by at least one modified via (41).
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