Invention Grant
- Patent Title: Method of automatically inspecting internal gas leak and method of manufacturing LED chip
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Application No.: US14795641Application Date: 2015-07-09
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Publication No.: US10066789B2Publication Date: 2018-09-04
- Inventor: Kung-don Han , Young-ki Kim , In Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2014-0096769 20140729
- Main IPC: G01M3/04
- IPC: G01M3/04 ; F17D5/06 ; G01M3/28

Abstract:
A method of inspecting an internal gas leak in a gas line includes providing an internal gas leak inspection device including a main valve and a pressure gauge in a main line between a first valve and a second valve in the gas line, forming an airtight space in the main line by shielding the main valve and the second valve, measuring a pressure variation of the airtight space using the pressure gauge, and determining whether or not the gas leak occurs, based on the measured pressure variation.
Public/Granted literature
- US20160033353A1 METHOD OF AUTOMATICALLY INSPECTING INTERNAL GAS LEAK AND METHOD OF MANUFACTURING LED CHIP Public/Granted day:2016-02-04
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