Invention Grant
- Patent Title: Three-dimensional shape measuring apparatus and control method thereof
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Application No.: US14095160Application Date: 2013-12-03
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Publication No.: US10066934B2Publication Date: 2018-09-04
- Inventor: Motomi Tsuyuki , Toshinori Ando
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2012-271775 20121212
- Main IPC: G01B11/25
- IPC: G01B11/25 ; H04N5/235 ; G01B11/06 ; G01B11/22 ; G01B11/24 ; G06T7/50

Abstract:
An exposure amount of at least one or more first patterns used to determine positions at the time of triangulation is set to be larger than that of other patterns, so as to reduce the influence of shot noise in the first patterns, to improve precision, and to reduce power consumption as a whole. To this end, a three-dimensional shape measuring apparatus, which measures a three-dimensional shape of an object to be measured by projecting pattern light of a plurality of types of patterns onto the object to be measured, and capturing images of the object to be measured, controls a projector unit and image capture unit to set an exposure amount of the first patterns to be larger than that of patterns other than the first patterns.
Public/Granted literature
- US20140160243A1 THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND CONTROL METHOD THEREOF Public/Granted day:2014-06-12
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