Invention Grant
- Patent Title: Optical sensor, optical inspection device, and optical property detection method for detecting light propagated inside a test object
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Application No.: US14982659Application Date: 2015-12-29
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Publication No.: US10067056B2Publication Date: 2018-09-04
- Inventor: Masayuki Fujiwara , Toshihiro Ishii , Yoichiro Takahashi , Toshihide Sasaki
- Applicant: Masayuki Fujiwara , Toshihiro Ishii , Yoichiro Takahashi , Toshihide Sasaki
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2015-000626 20150106; JP2015-238379 20151207
- Main IPC: G01N21/49
- IPC: G01N21/49 ; G01J1/04 ; A61B5/026 ; A61B5/00 ; A61B5/1455 ; G01N21/359 ; G01N21/47

Abstract:
An optical sensor including an irradiation system including at least one light irradiator, the at least one irradiator including a surface emitting laser array having a plurality of light-emitting units, and a lens disposed in an optical path of the plurality of rays of light emitted from the plurality of light-emitting units to cause light exit directions of at least two of the plurality of light-emitting units to be not parallel to each other, such that the at least one irradiator irradiates a same point of a test object with a plurality of rays of light that are not parallel to each other. The optical sensor also including a detection system configured to detect the plurality of rays of light that are emitted from the irradiation system and propagated inside the test object.
Public/Granted literature
- US20160195473A1 OPTICAL SENSOR, OPTICAL INSPECTION DEVICE, AND OPTICAL PROPERTY DETECTION METHOD Public/Granted day:2016-07-07
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