Invention Grant
- Patent Title: Method and particle analyzer for measuring a low concentration particle sample
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Application No.: US13339251Application Date: 2011-12-28
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Publication No.: US10067150B2Publication Date: 2018-09-04
- Inventor: Wenheng Guo , Baohua Yan , Tao Shen
- Applicant: Wenheng Guo , Baohua Yan , Tao Shen
- Applicant Address: CN Shenzhen
- Assignee: Shenzhen Mindray Bio-Medical Electronics Co., Ltd.
- Current Assignee: Shenzhen Mindray Bio-Medical Electronics Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Polsinelli LLP
- Agent Kory D. Christensen
- Priority: CN201010619703 20101231
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N35/00

Abstract:
A method and particle analyzer for measuring a low concentration particles sample disclosed.
Public/Granted literature
- US20120171714A1 METHOD AND PARTICLE ANALYZER FOR MEASURING A LOW CONCENTRATION PARTICLE SAMPLE Public/Granted day:2012-07-05
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