An method of generating a featured scan pattern for test includes: providing a plurality of predetermined test patterns to perform test on a plurality of devices under test (DUT) under a stress condition to generate a plurality of test responses of each DUT; grouping a plurality of specific test responses of each DUT from the test responses of each DUT to determine a feature value corresponding to a failure feature for each DUT; and generating at least one featured test pattern according to the feature value of each DUT.