Invention Grant
- Patent Title: Error correction code event detection
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Application No.: US15197446Application Date: 2016-06-29
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Publication No.: US10067827B2Publication Date: 2018-09-04
- Inventor: Yihua Zhang , Paolo E. Mangalindan , Jianfei Lei , Andrew D. Proescholdt , Gerard A. Kreifels
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/10 ; G11C29/50 ; G11C29/52 ; G11C29/04

Abstract:
Methods, systems, and devices for operating a memory cell or cells are described. An error in stored data may be detected by an error correction code (ECC) operation during sensing of the memory cells used to store the data. The error may be indicated in hardware by generating a measurable signal on an output node. For example, the voltage at the output node may be changed from a first value to a second value. A device monitoring the output node may determine an error has occurred for a set of data based at least in part on the change in the signal at the output node.
Public/Granted literature
- US20180004596A1 ERROR CORRECTION CODE EVENT DETECTION Public/Granted day:2018-01-04
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