Invention Grant
- Patent Title: Compound semiconductor substrate
-
Application No.: US15284781Application Date: 2016-10-04
-
Publication No.: US10068858B2Publication Date: 2018-09-04
- Inventor: Yoshihisa Abe , Kenichi Eriguchi , Noriko Omori , Hiroshi Oishi , Jun Komiyama
- Applicant: COORSTEK KK
- Applicant Address: JP Tokyo
- Assignee: COORSTEK KK
- Current Assignee: COORSTEK KK
- Current Assignee Address: JP Tokyo
- Agency: Buchanan, Ingersoll & Rooney PC
- Priority: JP2015-202862 20151014
- Main IPC: H01L31/0256
- IPC: H01L31/0256 ; H01L23/00 ; C30B25/18 ; C30B29/40 ; H01L21/02 ; H01L21/66 ; H01L29/04 ; H01L29/20 ; H01L29/205 ; H01L29/66 ; H01L29/778

Abstract:
A compound semiconductor substrate according to the present invention includes a compound semiconductor layer formed on one main surface of a ground substrate via a seed layer, wherein the ground substrate is formed of a sintered body, the seed layer is formed of a single crystal, the compound semiconductor layer includes a structure having a buffer layer and an active layer that are sequentially crystal-grown on the seed layer, a thermal expansion coefficient of the sintered body is 0.7 times or more and 1.4 times or less an average thermal expansion coefficient of the entire compound semiconductor layer, and an FWHM of an X-ray diffraction peak of the buffer layer obtained by an X-ray diffraction rocking curve measurement is 800 arcsec or less.
Public/Granted literature
- US20170110414A1 COMPOUND SEMICONDUCTOR SUBSTRATE Public/Granted day:2017-04-20
Information query
IPC分类: