Invention Grant
- Patent Title: Multi-wavelength detector array incorporating two dimensional and one dimensional materials
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Application No.: US15358783Application Date: 2016-11-22
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Publication No.: US10069028B2Publication Date: 2018-09-04
- Inventor: Michael Engel , Mathias B. Steiner
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armomk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armomk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Vazken Alexanian
- Main IPC: H01L31/10
- IPC: H01L31/10 ; H01L31/109 ; H01L31/0232 ; H01L31/0384 ; H01L31/18

Abstract:
A method of forming a wavelength detector that includes forming a first transparent material layer having a uniform thickness on a first mirror structure, and forming an active element layer including a plurality of nanomaterial sections and electrodes in an alternating sequence atop the first transparent material layer. A second transparent material layer is formed having a plurality of different thickness portions atop the active element layer, wherein each thickness portion correlates to at least one of the plurality of nanomaterials. A second mirror structure is formed on the second transparent material layer.
Public/Granted literature
- US20170309769A1 MULTI-WAVELENGTH DETECTOR ARRAY INCORPORATING TWO DIMENSIONAL AND ONE DIMENSIONAL MATERIALS Public/Granted day:2017-10-26
Information query
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