Invention Grant
- Patent Title: X-ray interferometer
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Application No.: US15235173Application Date: 2016-08-12
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Publication No.: US10074451B2Publication Date: 2018-09-11
- Inventor: Christian Kottler , Vincent Revol
- Applicant: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A.-RECHERCHE ET DEVELOPPEMENT
- Applicant Address: CH Zurich
- Assignee: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A.—RECHERCHE ET DEVELOPPEMENT
- Current Assignee: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A.—RECHERCHE ET DEVELOPPEMENT
- Current Assignee Address: CH Zurich
- Agency: Young & Thompson
- Priority: CH01753/11 20111028
- Main IPC: G21K1/06
- IPC: G21K1/06 ; G01N23/20 ; G02B5/18 ; G02B27/42 ; G01N23/20008 ; G02B27/00 ; A61B6/00 ; A61B6/06

Abstract:
Embodiments relate to an X-ray interferometer for imaging an object comprising: a phase grating for effecting in correspondence with the phase grating geometry a phase shift to at least a part of X-ray incident onto the phase grating; and an absorption grating for effecting in correspondence with the absorption grating geometry absorption to at least a part of X-ray incident onto the absorption grating. The grating period of the phase grating, and the grating period of the absorption grating may be dimensioned such that a detector for X-rays can be placed at a relatively large distance away from the absorption grating such the phase contrast sensitivity of the image of the object detected by the detector remains substantially unaffected.
Public/Granted literature
- US20160377559A1 X-RAY INTERFEROMETER Public/Granted day:2016-12-29
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