A method for the generative production of a component and a device for carrying out such a method, includes the following steps: applying a material layer with a constant layer thickness; solidifying a region of the material layer according to a component cross section; generating an eddy-current scan of the solidified region, a scan depth corresponding to a multiple of the layer thickness; determining a material characterization of the solidified region taking into consideration a previous eddy-current scan of solidified regions of lower-lying material layers; and repeating the steps until the component is assembled. An electric material characterization of each individual layer is determined using a recursive algorithm of individual measurements (monolayer by monolayer), and thus the entire component is tested step by step completely in a highly resolved manner.