Invention Grant
- Patent Title: Device health estimation by combining contextual information with sensor data
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Application No.: US14969984Application Date: 2015-12-15
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Publication No.: US10078062B2Publication Date: 2018-09-18
- Inventor: Hoda M. A. Eldardiry , Linxia Liao , Tomonori Honda , Bhaskar Saha , Rui Abreu
- Applicant: Palo Alto Research Center Incorporated
- Applicant Address: US CA Palo Alto
- Assignee: PALO ALTO RESEARCH CENTER INCORPORATED
- Current Assignee: PALO ALTO RESEARCH CENTER INCORPORATED
- Current Assignee Address: US CA Palo Alto
- Agency: Park, Vaughan, Fleming & Dowler LLP
- Agent Shun Yao
- Main IPC: G01N25/72
- IPC: G01N25/72 ; G05B13/00

Abstract:
A method and system for detecting fault in a machine. During operation, the system obtains control signals and corresponding sensor data that indicates a condition of the machine. The system determines consistent time intervals for each of the control signals. During a consistent time interval the standard deviation of a respective control signal is less than a respective predetermined threshold. The system aggregates the consistent time intervals to determine aggregate consistent intervals. The system then maps the aggregate consistent intervals to the sensor data to determine time interval segments for the sensor data. The system may generate features based on the sensor data. Each respective feature is generated from a time interval segment of the sensor data. The system trains a classifier using the features, and applies the classifier to additional sensor data indicating a condition of the machine over a period of time to detect a machine fault.
Public/Granted literature
- US20170167993A1 DEVICE HEALTH ESTIMATION BY COMBINING CONTEXTUAL INFORMATION WITH SENSOR DATA Public/Granted day:2017-06-15
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