Invention Grant
- Patent Title: Predicting solid state drive reliability
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Application No.: US15002216Application Date: 2016-01-20
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Publication No.: US10078455B2Publication Date: 2018-09-18
- Inventor: Iyswarya Narayanan , Di Wang , Myeongjae Jeon , Bikash Sharma , Laura Marie Caulfield , Sriram Govindan , Benjamin Franklin Cutler , Christopher W. Hoder , Jaya Naga Satish Bobba , Jie Liu , Badriddine Khessib
- Applicant: Microsoft Technology Licensing, LLC
- Agency: Ray Quinney & Nebeker, P.C.
- Agent Thomas M. Hardman; Stein E. Dolan
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
Aspects extend to methods, systems, and computer program products for predicting solid state drive reliability. Aspects of the invention can be used to predict and/or to configure a data center to minimize one or more of: SSD capacity degradation (how much storage an SSD has left), SSD performance degradation (reduced read/write latency/throughput), and SSD failure. Models and data center considerations can be based on device level SSD related operations, such as, for example, read, write, erase. Operations decisions can be made for a data center based on SSD specific features, such as, for example, remaining capacity, write amplification factor, etc. Dependence and/or causality of various different data center factors can be leveraged. The impact of the various data center factors on different SSD failure modes and capacity/performance degradation can be quantified to drive SSD design, SSD provisioning, and SSD operations.
Public/Granted literature
- US20170206026A1 PREDICTING SOLID STATE DRIVE RELIABILITY Public/Granted day:2017-07-20
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