Invention Grant
- Patent Title: Image sensor and method for fabricating the same
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Application No.: US15407541Application Date: 2017-01-17
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Publication No.: US10079259B2Publication Date: 2018-09-18
- Inventor: Shih-Chung Yu , Kai-Chieh Chuang
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsinchu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Priority: CN201510477505 20150806
- Main IPC: H01L27/146
- IPC: H01L27/146

Abstract:
An image sensor includes a semiconductor substrate, a plurality of photoelectric transducer devices, a dielectric isolating structure and a plurality of spacers. The semiconductor substrate has a backside surface and a front side surface opposite to the backside surface. The photoelectric transducer devices are disposed on the front side surface. The dielectric isolating structure extends downwards into the semiconductor substrate from the front side surface and penetrates through the backside surface, so as to from a grid structure and isolate the photoelectric transducer devices from each other. The spacers are disposed on a plurality of sidewalls of the grid structure.
Public/Granted literature
- US20170125462A1 IMAGE SENSOR AND METHOD FOR FABRICATING THE SAME Public/Granted day:2017-05-04
Information query
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