Invention Grant
- Patent Title: Apparatus and method for measuring power supply noise
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Application No.: US15457588Application Date: 2017-03-13
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Publication No.: US10079648B2Publication Date: 2018-09-18
- Inventor: Tzu-Chien Hsueh , Frank O'Mahony
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Green, Howard & Mughal LLP
- Main IPC: H04B15/00
- IPC: H04B15/00 ; H04B17/10 ; H04B17/345

Abstract:
Described is an apparatus which comprises: a power delivery distribution network (PDN) to provide a power supply to at least one circuit; and an on-die synchronous power supply noise injector to inject noise to the power supply on the PDN. Described is another apparatus which comprises: a PDN to provide power supply to various circuits; an on-die power supply noise (PSN) sampler to sample the power supply with an injected noise, wherein the PSN sampler to sample the power supply with at least two different clock signals; and a phase noise accumulator to randomize the periods of the at least two different clock signals.
Public/Granted literature
- US20170187476A1 APPARATUS AND METHOD FOR MEASURING POWER SUPPLY NOISE Public/Granted day:2017-06-29
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