Invention Grant
- Patent Title: Substrate cleaning method for removing oxide film
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Application No.: US15161892Application Date: 2016-05-23
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Publication No.: US10083830B2Publication Date: 2018-09-25
- Inventor: Takuya Seino , Manabu Ikemoto , Kimiko Mashimo
- Applicant: CANON ANELVA CORPORATION
- Applicant Address: JP Kawasaki-Shi
- Assignee: CANON ANELVA CORPORATION
- Current Assignee: CANON ANELVA CORPORATION
- Current Assignee Address: JP Kawasaki-Shi
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JPPCT/JP2007/071393 20071102
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/28 ; H01L21/67 ; H01J37/32 ; H01L29/51 ; H01L29/49 ; H01L29/66

Abstract:
It was found out that when radicals generated by plasma are fed to a treatment chamber via a plurality of holes (111) formed on a partition plate which separates a plasma-forming chamber (108) from the treatment chamber, and the radicals are mixed with a treatment gas which is separately fed to the treatment chamber, the excitation energy of the radicals is suppressed and thereby the substrate surface treatment at high Si-selectivity becomes possible, which makes it possible to conduct the surface treatment of removing native oxide film and organic matter without deteriorating the flatness of the substrate surface. The radicals in the plasma are fed to the treatment chamber via radical-passing holes (111) of a plasma-confinement electrode plate (110) for plasma separation, the treatment gas is fed to the treatment chamber (121) to be mixed with the radicals in the treatment chamber, and then the substrate surface is cleaned by the mixed atmosphere of the radicals and the treatment gas.
Public/Granted literature
- US20160343565A1 SUBSTRATE CLEANING METHOD FOR REMOVING OXIDE FILM Public/Granted day:2016-11-24
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