Invention Grant
- Patent Title: Method and apparatus for detecting and mitigating mechanical misalignments in an optical system
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Application No.: US14661603Application Date: 2015-03-18
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Publication No.: US10085001B2Publication Date: 2018-09-25
- Inventor: Takeshi Shoji , John Drinkard , Ambrish Tyagi
- Applicant: Omron Corporation
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H04N13/00
- IPC: H04N13/00 ; H04N13/02 ; G06T7/80

Abstract:
According to one aspect of the teachings herein, a method and apparatus detect mechanical misalignments in a machine vision system during run-time operation of the machine vision system, and compensate image processing based on the detected misalignments, unless the detected misalignments are excessive. Excessive misalignments may be detected by determining a worst-case error based on them. If the worst-case error exceeds a defined limit, the machine vision system transitions to a fault state. The fault state may include disrupting operation of a hazardous machine or performing one or more other fault-state operations. Among the detected misalignments are internal misalignments within individual cameras used for imaging, and relative misalignments between cameras. The method and apparatus may further perform run-time verifications of focus and transition the machine vision system to a fault state responsive to detecting insufficient focal quality.
Public/Granted literature
- US20150271474A1 Method and Apparatus for Detecting and Mitigating Mechanical Misalignments in an Optical System Public/Granted day:2015-09-24
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