Invention Grant
- Patent Title: Image measurement device
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Application No.: US15620844Application Date: 2017-06-13
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Publication No.: US10088301B2Publication Date: 2018-10-02
- Inventor: Takashi Naruse , Koji Takahashi
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2016-132920 20160704
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01B11/25 ; G06T7/13 ; G06T7/70 ; G06K9/46 ; G06K9/62 ; G01B21/04 ; G05B19/00

Abstract:
There are included a display section for displaying a model image, an input receiving section for receiving designation, in the model image, of a measurement element for which measurement is to be performed by the probe, a storage section storing, in advance, an arrangement rule defining a relationship between a shape type or a size of a measurement element and arranged positions of contact target positions of the probe, and a measurement control section for identifying, at a time of measurement execution, contact target positions of the probe based on a position of the measurement element designated by the input receiving section, a shape type or a size of the measurement element, and the arrangement rule that is stored in the storage section, and for controlling a horizontal drive section so that the probe sequentially moves to the plurality of contact target positions identified.
Public/Granted literature
- US20180003485A1 Image Measurement Device Public/Granted day:2018-01-04
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