Invention Grant
- Patent Title: Image measurement device
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Application No.: US15620843Application Date: 2017-06-13
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Publication No.: US10088302B2Publication Date: 2018-10-02
- Inventor: Koji Takahashi , Takashi Naruse , Hayato Oba
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2016-132919 20160704
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01B11/25 ; G06T7/13 ; G06T7/70 ; G01B5/02 ; G06K9/46 ; G06K9/62 ; G01B21/04 ; G05B19/00

Abstract:
There are included a probe that can be arranged in an imaging field of view, a horizontal drive section for causing the probe to contact a side surface of a workpiece on a stage, a display section for displaying a model image, a contact position designation section for receiving designation of contact target position information in the model image, a characteristic amount information setting section for setting characteristic amount information, a measurement setting information storage section for storing a plurality of pieces of contact target position information and the characteristic amount information, and a measurement control section for identifying a position and an attitude of the workpiece from a workpiece image by using the characteristic amount information, for identifying a plurality of contact target positions on the side surface of the workpiece where the probe should contact, based on the identified position and the identified attitude of the workpiece.
Public/Granted literature
- US20180003487A1 Image Measurement Device Public/Granted day:2018-01-04
Information query