Invention Grant
- Patent Title: Computing device, computing program, X-ray measuring system and X-ray measuring method
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Application No.: US14441494Application Date: 2013-10-28
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Publication No.: US10088437B2Publication Date: 2018-10-02
- Inventor: Taihei Mukaide
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc., IP Division
- Priority: JP2012-248625 20121112
- International Application: PCT/JP2013/079659 WO 20131028
- International Announcement: WO2014/073462 WO 20140515
- Main IPC: G01N23/083
- IPC: G01N23/083 ; G01N23/207 ; G01N23/046

Abstract:
A computing device configured to obtain information about a subject using a detection result detected by an X-ray detector which detects an X-ray passing through the subject, which device includes: a unit configured to obtain a detection result of the X-ray detector; a first obtaining unit configured to obtain a complex refractive index of the X-ray after passing through the subject using the detection result; and a second obtaining unit configured to obtain information about the subject in accordance with a correlation between the complex refractive index and a mass absorption coefficient.
Public/Granted literature
- US20150293041A1 COMPUTING DEVICE, COMPUTING PROGRAM, X-RAY MEASURING SYSTEM AND X-RAY MEASURING METHOD Public/Granted day:2015-10-15
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