Invention Grant
- Patent Title: Method for detecting defects in conductive materials based on differences in magnetic field characteristics measured along the conductive materials
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Application No.: US15003145Application Date: 2016-01-21
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Publication No.: US10088452B2Publication Date: 2018-10-02
- Inventor: Joseph A. Villani, Jr. , John B. Stetson, Jr.
- Applicant: Lockheed Martin Corporation
- Applicant Address: US MD Bethesda
- Assignee: LOCKHEED MARTIN CORPORATION
- Current Assignee: LOCKHEED MARTIN CORPORATION
- Current Assignee Address: US MD Bethesda
- Agency: Foley & Lardner LLP
- Main IPC: G01N27/82
- IPC: G01N27/82
Abstract:
A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second portion of the length of material. The method further includes determining that the material includes a defect along the second portion of the length of material by determining that the first magnetic field magnitude is different than the second magnetic field magnitude.
Public/Granted literature
- US20170199156A1 DEFECT DETECTOR FOR CONDUCTIVE MATERIALS Public/Granted day:2017-07-13
Information query
