Invention Grant
- Patent Title: Electronic device and method for determining defect in an electronic device
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Application No.: US14918857Application Date: 2015-10-21
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Publication No.: US10088515B2Publication Date: 2018-10-02
- Inventor: Sung-Su Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Cha & Reiter, LLC
- Priority: KR10-2014-0143187 20141022
- Main IPC: G01R31/04
- IPC: G01R31/04

Abstract:
According to an embodiment of the present disclosure, an electronic device may comprise an external device connector having at least one connection sensing pin to sense connection to at least one external device connector, a voltage sensor measuring a voltage at the at least one connection sensing pin and a controller determining that a defect occurs when the voltage measured by the voltage sensor meets a preset condition. Other various embodiments are also provided herein.
Public/Granted literature
- US20160116509A1 ELECTRONIC DEVICE AND METHOD FOR DETERMINING DEFECT IN AN ELECTRONIC DEVICE Public/Granted day:2016-04-28
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