Invention Grant
- Patent Title: Pellicle for EUV exposure
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Application No.: US15379731Application Date: 2016-12-15
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Publication No.: US10088745B2Publication Date: 2018-10-02
- Inventor: Akinori Nishimura , Toru Shirasaki
- Applicant: SHIN-ETSU CHEMICAL CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2015-251238 20151224
- Main IPC: G03F1/64
- IPC: G03F1/64 ; G03F1/62 ; G03F7/20

Abstract:
There is provided a pellicle for EUV lithography, which has a filter attached to a vent hole made through a pellicle frame bar for air pressure adjustment, and this filter is designed to be heat-resistant by being made of either a metal or a ceramic material, and is adhered to the pellicle frame by weldering or soldering, and also the filter has a filtration accuracy of 0.1 through 0.3 μm.
Public/Granted literature
- US20170184955A1 PELLICLE FOR EUV EXPOSURE Public/Granted day:2017-06-29
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