Invention Grant
- Patent Title: Inspection apparatus and method
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Application No.: US15381980Application Date: 2016-12-16
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Publication No.: US10088762B2Publication Date: 2018-10-02
- Inventor: Stefan Michiel Witte , Kjeld Sijbrand Eduard Eikema
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Priority: EP15201162 20151218
- Main IPC: G01N23/2055
- IPC: G01N23/2055 ; G03F9/00 ; G01B15/00 ; H05G2/00 ; G03F7/20

Abstract:
A lithographic apparatus is a machine that applies a desired pattern onto a substrate, usually onto a target portion of the substrate. A lithographic apparatus can be used, for example, in the manufacture of integrated circuits (ICs). The lithographic apparatus has an inspection apparatus with an EUV radiation source. The radiation source emits a radiation beam that includes coherent radiation of a specific wavelength. The beam propagates to illumination optical system, which focuses the radiation beam into a focused beam of illuminating radiation. The illumination optical system illuminates a three-dimensional product structure on the substrate, which scatters the illuminating radiation. On the surface of a detector, the radiation scattered by the product structure forms a diffraction pattern that is used to reconstruct data describing the three-dimensional product structure.
Public/Granted literature
- US20170176879A1 Inspection Apparatus and Method Public/Granted day:2017-06-22
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