Invention Grant
- Patent Title: Diagnostic device and method for monitoring the operation of a control loop
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Application No.: US15012177Application Date: 2016-02-01
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Publication No.: US10088829B2Publication Date: 2018-10-02
- Inventor: Patrick Heiler , Bernd-Markus Pfeiffer
- Applicant: Siemens Aktiengesellschaft
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Cozen O'Connor
- Priority: EP15155283 20150216
- Main IPC: G05B13/02
- IPC: G05B13/02 ; G05B19/406 ; G05B23/02

Abstract:
A diagnostic device and method for monitoring the operation of a slave or ratio control loop in a meshed control structure of an automation system. The diagnostic device includes an evaluation device and a data memory for storing sequences of setpoint data and actual value data. The evaluation device determines a first dimension for the scatter of the actual-value data and a second dimension for the scatter of the setpoint data. A characteristic number (CPIVar, CPIKas) for evaluating control quality is determined and/or displayed as a function of the ratio of the first dimension to the second dimension to enable an operator to evaluate the control loop status, permitting automated control loop evaluation of a fluctuating setpoint.
Public/Granted literature
- US20160239015A1 Diagnostic Device And Method For Monitoring The Operation Of A Control Loop Public/Granted day:2016-08-18
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