Invention Grant
- Patent Title: Fin profile improvement for high performance transistor
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Application No.: US15018175Application Date: 2016-02-08
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Publication No.: US10090205B2Publication Date: 2018-10-02
- Inventor: Ka-Hing Fung
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: SG Singapore
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: SG Singapore
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: H01L21/8238
- IPC: H01L21/8238 ; H01L29/78 ; H01L21/3065 ; H01L21/308 ; H01L27/092 ; H01L29/06 ; H01L29/66

Abstract:
A finFET semiconductor device and method for fabricating such a device are presented. The semiconductor device includes a first fin formed in a first semiconducting layer, a second fin formed in a second semiconducting layer, and an insulating layer disposed between the first fin and the second fin. The first fin, the second fin, and the insulating layer form a stacked structure above a substrate.
Public/Granted literature
- US20170229351A1 FIN PROFILE IMPROVEMENT FOR HIGH PERFORMANCE TRANSISTOR Public/Granted day:2017-08-10
Information query
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