Invention Grant
- Patent Title: Integrated packaging structure
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Application No.: US15447800Application Date: 2017-03-02
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Publication No.: US10090298B2Publication Date: 2018-10-02
- Inventor: Chien-Chung Chen , Sen Mao , Hsin-Liang Lin
- Applicant: TAIWAN SEMICONDUCTOR CO., LTD.
- Applicant Address: TW New Taipei
- Assignee: TAIWAN SEMICONDUCTOR CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR CO., LTD.
- Current Assignee Address: TW New Taipei
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW106201068U 20170120
- Main IPC: H01L23/495
- IPC: H01L23/495 ; H01L27/088 ; H01L29/06 ; H01L29/417

Abstract:
An integrated packaging structure is provided. In the package structure, an integrated component body has a first source region, a second source region, a first setting region, and a second setting region, which are separated from each other. A first MOSFET die and a second MOSFET die are located on the first setting region and the second setting region respectively, and have a top surface, a source electrode pad and a gate electrode pad. The source electrode pad and the gate electrode pad are exposed from the top surface and spaced apart from each other. A first source connection element is connected to the source electrode pad of the first MOSFET die and the first source region. A second source connection element is connected to the source electrode pad of the second MOSFET die and the second source region. A gate connection element is connected to the gate electrode pad and a gate region of the integrated component body.
Public/Granted literature
- US20180211953A1 INTEGRATED PACKAGING STRUCTURE Public/Granted day:2018-07-26
Information query
IPC分类: