Invention Grant
- Patent Title: Location determination method and location determination system for sensor apparatus placements in building
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Application No.: US14655369Application Date: 2014-12-15
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Publication No.: US10091674B2Publication Date: 2018-10-02
- Inventor: Jeong-Ho Kim
- Applicant: EWHA UNIVERSITY-INDUSTRY COLLABORATION FOUNDATION
- Applicant Address: KR Seoul
- Assignee: EWHA UNIVERSITY-INDUSTRY COLLABORATION FOUNDATION
- Current Assignee: EWHA UNIVERSITY-INDUSTRY COLLABORATION FOUNDATION
- Current Assignee Address: KR Seoul
- Agency: Paratus Law Group, PLLC
- Priority: KR10-2014-0120272 20140911; KR10-2014-0137320 20141013
- International Application: PCT/KR2014/012330 WO 20141215
- International Announcement: WO2016/039507 WO 20160317
- Main IPC: H04W24/06
- IPC: H04W24/06 ; H04L12/28 ; G01S5/00 ; H04L12/26

Abstract:
A location determining method 200 for sensor apparatus placements in building includes: a step in which a first measuring device transmits a digitally modulated first test packet through a specific channel at a first location in a building (210); a step in which a second measuring device receives the first test packet and transmits a first echo back signal through the specific channel at a second location in the building (220); a step in which the first measuring device receives the first echo back signal transmitted from the second measuring device and measures a first channel quality of the specific channel based on the first echo back signal (230); a step in which the first measuring device transmits a digitally modulated second test packet through the specific channel (240); a step in which the second measuring device receives the second test packet and transmits a second echo back signal through the specific channel (250); and a step in which the first measuring device receives the second echo back signal transmitted from the second measuring device and measures a second channel quality of the specific channel based on the second echo back signal (260).
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