Invention Grant
- Patent Title: Method for manufacturing a power semiconductor device
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Application No.: US15669537Application Date: 2017-08-04
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Publication No.: US10103227B2Publication Date: 2018-10-16
- Inventor: Holger Huesken , Anton Mauder , Hans-Joachim Schulze , Wolfgang Roesner
- Applicant: Infineon Technologies Austria AG
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L29/872 ; H01L29/739 ; H01L29/08 ; H01L29/66 ; H01L29/36 ; H01L29/861

Abstract:
A method for manufacturing a power semiconductor device includes: forming a drift region of a first conductivity type, a second emitter region of a second conductivity type, a pn-junction between the second emitter region and drift region, and a first emitter region having a first doping region of the first conductivity type and a second doping region of the first conductivity type; forming a first emitter metallization in contact with the first emitter region to form an ohmic contact between the first emitter metallization and the first doping region, and to form a non-ohmic contact between the first emitter metallization and the second doping region; and forming a second emitter metallization in contact with the second emitter region. The first emitter region is formed using a mask that is aligned with respect to the second emitter region, so that the first and second doping regions are formed in aligned relation.
Public/Granted literature
- US20170338306A1 Method for Manufacturing a Power Semiconductor Device Public/Granted day:2017-11-23
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