Invention Grant
- Patent Title: Attribute factor analysis method, device, and program
-
Application No.: US15127216Application Date: 2014-03-28
-
Publication No.: US10108848B2Publication Date: 2018-10-23
- Inventor: Yasuyuki Ihara , Masashi Sugiyama
- Applicant: NEC SOLUTION INNOVATORS, LTD.
- Applicant Address: JP Tokyo
- Assignee: NEC SOLUTION INNOVATORS, LTD.
- Current Assignee: NEC SOLUTION INNOVATORS, LTD.
- Current Assignee Address: JP Tokyo
- International Application: PCT/JP2014/059906 WO 20140328
- International Announcement: WO2015/145785 WO 20151001
- Main IPC: G06K9/50
- IPC: G06K9/50 ; G06K9/00 ; G06T7/11

Abstract:
This invention relates to a method of analyzing a factor of an attribute based on a case sample set containing combinations of image data and attribute data associated with the image data. The attribute factor analysis method includes: a division step of dividing an image region of the image data forming each element of the case sample set into parts in a mesh shape of a predetermined sample size; a reconstruction step of reconstructing, based on the case sample set, the case sample sets for the respective parts to obtain reconstructed case sample sets; an analysis step of analyzing, for each of the reconstructed case sample sets, a dependency between an explanatory variable representing a feature value of image data on each part and an objective variable representing the attribute data, to thereby obtain an attribute factor analysis result; and a visualization step of visualizing the attribute factor analysis result to produce the visualized attribute factor analysis result.
Public/Granted literature
- US20170109567A1 ATTRIBUTE FACTOR ANALYSIS METHOD, DEVICE, AND PROGRAM Public/Granted day:2017-04-20
Information query