Invention Grant
- Patent Title: Program and read trim setting
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Application No.: US15341410Application Date: 2016-11-02
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Publication No.: US10109351B2Publication Date: 2018-10-23
- Inventor: Seiichi Aritome
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/10 ; G11C16/26
Abstract:
A trim set register for a memory device has a plurality of individual trim settings. Each trim setting has a program trim value, a step-up trim value, and a program pulse width. A trim setting may be assigned to a portion of the memory device based on a program speed of the portion of the memory device.
Public/Granted literature
- US20170053701A1 PROGRAM AND READ TRIM SETTING Public/Granted day:2017-02-23
Information query
