Invention Grant
- Patent Title: Method of specimen processing in an apparatus with two or more particle beams and apparatus for this processing
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Application No.: US14904409Application Date: 2014-07-09
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Publication No.: US10109457B2Publication Date: 2018-10-23
- Inventor: Filip Lopour , Tomas Hrncir
- Applicant: TESCAN ORSAY HOLDING, A.S.
- Applicant Address: CZ Brno
- Assignee: Tescan Orsay Holding, A.S.
- Current Assignee: Tescan Orsay Holding, A.S.
- Current Assignee Address: CZ Brno
- Agency: Hitaffer & Hitaffer, PLLC
- Agent Thedford I. Hitaffer
- Priority: CZ2013-547 20130711
- International Application: PCT/CZ2014/000078 WO 20140709
- International Announcement: WO2015/003671 WO 20150115
- Main IPC: G01N1/28
- IPC: G01N1/28 ; H01J37/30 ; G01N1/32

Abstract:
A method and apparatus for processing a specimen with two or more particle beams, wherein the specimen has a milled side that is processed by a first particle beam and observed by a second particle beam. The specimen is milled during a first milling operation by the first particle beam with the specimen in a first position. Thereafter, the specimen tilts in a second position around an axis of tilt of the specimen. Thereafter, the specimen is milled during a second milling operation. Milling can be performed during continuous tilting of the specimen around the axis of tilt. The axis of tilt of the specimen intersects the milled side. In all the aforementioned positions of the specimen, the second particle beam impinges on the milled side, which enables monitoring of the milling in real time.
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