Invention Grant
- Patent Title: Repair structure of line defect of AMOLED display panel and repair method
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Application No.: US15105576Application Date: 2016-04-25
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Publication No.: US10109688B2Publication Date: 2018-10-23
- Inventor: Baixiang Han
- Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Shenzhen, Guangdong
- Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen, Guangdong
- Agent Leong C. Lei
- Priority: CN201610178046 20160324
- International Application: PCT/CN2016/080102 WO 20160425
- International Announcement: WO2017/161623 WO 20170928
- Main IPC: H01L27/32
- IPC: H01L27/32 ; G09G3/00 ; H01L21/66 ; H01L21/768

Abstract:
The present invention provides a repair structure of a line defect of an AMOLED display panel and a repair method. The conductive film (410) correspondingly overlaps and covers above the test TFT (310) and is insulated from the test TFT (310), and the repair line (420) is insulated and crossed with all the signal fanout lines (200) and the corresponding test line (330). It is realized that the repair line is directly grafted on the AMOLED display panel detecting circuit, which can utilize the present detecting circuit layout of the AMOLED display panel capable of introducing the repair line for having the repair function and saving the layout space, and has no additional requirement to the control IC, and particularly, can be applicable for the line defect repair of the small size, high resolution AMOLED display panel.
Public/Granted literature
- US20180102396A1 REPAIR STRUCTURE OF LINE DEFECT OF AMOLED DISPLAY PANEL AND REPAIR METHOD Public/Granted day:2018-04-12
Information query
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