Invention Grant
- Patent Title: Methods and systems for detecting cracks in electronic devices
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Application No.: US15130851Application Date: 2016-04-15
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Publication No.: US10127647B2Publication Date: 2018-11-13
- Inventor: Babak Forutanpour , Jeffrey Ploetner
- Applicant: ecoATM, LLC
- Applicant Address: US CA San Diego
- Assignee: ecoATM, LLC
- Current Assignee: ecoATM, LLC
- Current Assignee Address: US CA San Diego
- Agency: Perkins Coie LLP
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/60 ; G01N21/88 ; G06T7/13

Abstract:
Systems and methods for detecting cracks in an electronic device are disclosed. In one embodiment, the method includes receiving an image of a front side of a mobile device and automatically identifying edges in the image. For given edges among the identified edges, the method includes determining whether another edge among the identified edges is present within a predetermined distance of the given edge. Next, straight line segments corresponding to the edges for which another edge is within the predetermined distance are identified, and then a crack evaluation assessment is assigned to the mobile device based at least in part on the identified straight line segments.
Public/Granted literature
- US20170301078A1 METHODS AND SYSTEMS FOR DETECTING CRACKS IN ELECTRONIC DEVICES Public/Granted day:2017-10-19
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